Abstract. The structure of the organization of integrated control circuits for logic devices of automation and computer technology based on the use of two diagnostic parameters (hybrid structure) is proposed. As the first diagnostic parameter, belonging of the controlled functions in the circuit to a pre-selected redundant code is taken, and as the second diagnostic parameter, the affiliation of each function to a class of self-dual functions is considered. A detailed description of the hybrid structure of the organization of the integrated control circuit is given. Special cases of its implementation are considered — the use of "2 out of 4" constant-weight code codes and standard compression modules for two-rail signals. The possibilities of using specialized circuits for pre-compression of signals from the outputs of the diagnostic object necessary to reduce structural redundancy during the synthesis of the integrated control circuit are demonstrated. An example of the implementation of the integrated control circuit scheme for a hybrid structure is given. The algorithm of step-by-step determination of the functions of the control logic block is considered, taking into account the features of the implementation of a fully self-checking digital device.

Keywords: self-checking device, built-in self-checking monitoring circuit, computing check, belonging to a given redundant code control, “2 out of 4” constant-weight code, self-dual Boolean control, control by two diagnostic parameters

References:

1. Ubar R., Raik J., Vierhaus H.-T. Design and Test Technology for Dependable Systems-on-Chip (Premier Reference Source), Information Science Reference, Hershey, NY, IGI Global, 2011, 578 p.
2. Drozd A.V., Kharchenko V.S., Antoshchuk S.G., Drozd Yu.V., Drozd M.A., Sulima Yu.Yu. Rabocheye diagnostirovaniye bezopasnykh informatsionno-upravlyayushchikh sistem (Working Diagnostics of Safe Information and Control Systems), Khar’kov, 2012, 614 р. (in Russ.)
3. Drozd O., Antoniuk V., Nikul V., Drozd M. Proceedings of the 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavsko, Ukraine, February 20–24, 2018, pp. 805–809, DOI: 10.1109/TCSET.2018.8336320.
4. Drozd O., Perebeinos I., Martynyuk O., Zashcholkin K., Ivanova O., Drozd M. Proceedings of the IEEE International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET), February 25–29, 2020, Lviv-Slavsko, Ukraine, paper 142, DOI: 10.1109/TCSET49122.2020.235591.
5. Parkhomenko P.P., Sogomonyan E.S. Osnovy tekhnicheskoy diagnostiki. Optimizatsiya algoritmov diagnostirovaniya, apparaturnye sredstva (Basics of Technical Diagnostics. Optimization of Algorithms of Diagnosing, Hardware Means), Moscow, 1981, 320 р. (in Russ.)
6. Sogomonyan E.S., Slabakov E.V. Samoproveryaemye ustroystva i otkazoustoychivye sistemy (The Self-Checked Devices and Failure-Safe Systems), Moscow, 1989, 208 р. (in Russ.)
7. Mitra S., McCluskey E.J. Proceedings of International Test Conference, 2000, USA, Atlantic City, NJ, October 03–05 2000, pp. 985–994, DOI: 10.1109/TEST.2000.894311.
8. Baghdadi A.A.A., Khakhanov V.I., Litvinova E.I. Automated control systems and automation devices, 2014, no. 166, pp. 59–74. (in Russ.)
9. Piestrak S.J. Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wrocław, Oficyna Wydawnicza Politechniki Wrocłavskiej, 1995, 111 p.
10. Gangopadhyay D., Reyhani-Masoleh A. IEEE Transactions on Computers, 2016, no. 7(65), pp. 2143–2157, DOI: 10.1109/TC.2015.2479617.
11. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Kody s summirovaniyem dlya sistem tekhnicheskogo diagnostirovaniya. T. 1. Klassicheskiye kody Bergera i ikh modifikatsii (Summed Codes for Technical Diagnostic Systems. Vol. 1. Classical Berger Codes and Their Modifications), Moscow, 2020, 383 р. (in Russ.)
12. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Kody s summirovaniyem dlya sistem tekhnicheskogo diagnostirovaniya. T. 2. Vzveshennyye kody s summirovaniyem (Summed Codes for Technical Diagnostic Systems. Vol. 2. Weighted Codes with Summation), Moscow, 2021, 455 р. (in Russ.)с.
13. Bayat-Sarmadi S., Hasan M.A. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2007, vol. 15, pp. 413–426, DOI: 10.1109/TVLSI.2007.893659.
14. Qiu W., Zhang X., Li H., Wang Z., Zhang Y., Zheng Z. Applied Mathematics & Information Sciences, 2013, no. 3(7), pp. 947–954.
15. Tshagharyan G., Harutyunyan G., Shoukourian S., Zorian Y. Proceedings of 15th IEEE East-West Design & Test Symposium (EWDTS’2017), Novi Sad, Serbia, September 29–October 2, 2017, pp. 25–28, DOI: 10.1109/EWDTS.2017.8110065.
16. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Kody Khemminga v sistemakh funktsional'nogo kontrolya logicheskikh ustroystv (Hamming Codes in Logic Devices Functional Control Systems), St. Petersburg, 2018, 151 р. (in Russ.)
17. Gessel M., Dmitriev A.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control, 1999, no. 11(60), pp. 1653–1663.
18. Gessel' M., Dmitriev A.V., Sapozhnikov V.V., Sapozhnikov Vl.A. Automation and Remote Control, 2000, no. 7(61), pp. 1192–1200.
19. Efanov D., Sapozhnikov V., Sapozhnikov Vl., Osadchy G., Pivovarov D. Proceedings of 17th IEEE East-West Design & Test Symposium (EWDTS’2019), Batumi, Georgia, September 13–16, 2019, pp. 136–143, DOI: 10.1109/EWDTS.2019.8884398.
20. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V., Pivovarov D.V. Electronic modeling, 2020, no. 3(42), pp. 27–52, DOI: 10.15407/emodel.42.03.027.
21. Sogomonyan E.S., Gössel M. Journal of Electronic Testing: Theory and Applications, 1993, no. 4(4), pp. 267–281, DOI: 10.1007/BF00971975.
22. Busaba F.Y., Lala P.K. Journal of Electronic Testing: Theory and Applications, 1994, no. 1, pp. 19–28, DOI: 10.1007/BF00971960.
23. Matrosova A.Yu., Ostanin S.A. Proceedings of the IEEE European Test Workshop (ETW’98), May 27–29, 1998, Sitges, Barcelona, Spain.
24. Morosow A., Saposhnikov V.V., Saposhnikov Vl.V., Goessel M. VLSI Design, 1998, no. 4(5), pp. 333–345, DOI: 10.1155/1998/20389.
25. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automatic Control and Computer Sciences, 2020, no. 4(54), pp. 279–290, DOI: 10.3103/S0146411620040045.
26. Mikoni S.V. Obshchiye diagnosticheskiye bazy znaniy vychislitel'nykh sistem (General Diagnostic Knowledge Bases of Computing Systems), St. Petersburg, 1992, 234 р. (in Russ.)
27. Efanov D.V., Pivovarov D.V. Proceedings of 19th IEEE East-West Design & Test Symposium (EWDTS’2021), Batumi, Georgia, September 10–13, 2021. Р. 200—206. DOI: 10.1109/EWDTS52692.2021.9581019.
28. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automatic Control and Computer Sciences, 2021, no. 2(55), pp. 113–124, DOI: 10.3103/S014641162102005X.
29. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Information Technologies, 2021, no. 6, pp. 306–313, DOI: 10.17587/it.27.306-313.
30. Nikolos D. Chapter 7 in On-Line Testing for VLSI, 1998, pp. 69–79, DOI 10.1007/978-1-4757-60-69-9_7.
31. Sapozhnikov V.V., Sapozhnikov Vl.V. Gessel M. Samodvoystvennyye diskretnyye ustroystva (Self-Dual Discrete Devices), St. Petersburg, 2001, 331 р. (in Russ.)
32. Sapozhnikov V.V., Sapozhnikov Vl.V.., Valiev R.Sh. Sintez samodvoystvennykh diskretnykh sistem (Synthesis of Self-Dual Discrete Systems), St. Petersburg, 2006, 220 р. (in Russ.)
33. Göessel M., Ocheretny V., Sogomonyan E., Marienfeld D. New Methods of Concurrent Checking: Edition 1, Dordrecht, Springer Science+Business Media B.V., 2008, 184 p.
34. Patent US747533, Self-Checking Error Checker for Two-Rail Coded Data, W.C. Carter, K.A. Duke, P.R. Schneider, Priority July 25, 1968, Published Jan. 26, 1971.
35. Sapozhnikov V.V., Sapozhnikov Vl.V. Samoproveryaemye diskretnye ustroystva (The Self-Checked Discrete Devices), St. Petersburg, 1992, 224 p. (in Russ.)
36. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V., Osadchy G.V. Vestnik Tomskogo gosudarstvennogo universiteta Upravlenie vychislitel'naya tekhnika i informatika (Tomsk State University Journal of Control and Computer Science), 2021, no. 1, pp. 97–115, DOI: 10.17223/19988605/54/12. (in Russ.)
37. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V., Pivovarov D.V. Automatic Control and Computer Sciences, 2019, no. 6(53), pp. 481–491, DOI: 10.3103/S014641161906004X.
38. Drozd A., Kharchenko V., Antoshchuk S., Sulima J., Drozd M. Proceedings of 9th IEEE East-West Design & Test Symposium (EWDTS’2011), Sevastopol, Ukraine, 2011, pp. 411–416, DOI: 10.1109/EWDTS.2011.6116606.
39. Sapozhnikov Vl.V. Sintez sistem upravleniya dvizheniyem poyezdov na zheleznodorozhnykh stantsiyakh s isklyucheniyem opasnykh otkazov (Synthesis of Control Systems for the Movement of Trains at Railway Stations with the Exclusion of Dangerous Failures), Moscow, 2021, 229 р. (in Russ.)