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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">pribor</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений. Приборостроение</journal-title><trans-title-group xml:lang="en"><trans-title>Journal of Instrument Engineering</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0021-3454</issn><issn pub-type="epub">2500-0381</issn><publisher><publisher-name>Национальный исследовательский университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/0021-3454-2025-68-4-310-319</article-id><article-id custom-type="elpub" pub-id-type="custom">pribor-362</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОПТИЧЕСКИЕ И ОПТИКО-ЭЛЕКТРОННЫЕ ПРИБОРЫ И КОМПЛЕКСЫ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>OPTICAL AND OPTOELECTRONIC DEVICES AND COMPLEXES</subject></subj-group></article-categories><title-group><article-title>Зависимость оптических потерь от толщины буферного слоя между волноводом из тонкопленочного ниобата лития и металлическим электродом</article-title><trans-title-group xml:lang="en"><trans-title>Dependence of Optical Losses on the Thickness of the Buffer Layer Between a Thin-film Lithium Niobate Waveguide and a Metal Electrode</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Булатова</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Bulatova</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Анна Владимировна Булатова — аспирант кафедра общей физики; инженер‑исследователь</p><p>Пермь</p></bio><bio xml:lang="en"><p>Anna V. Bulatova — Post-Graduate Student Department of General Physics; research engineer</p><p>Perm</p></bio><email xlink:type="simple">fofanova1996@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Москалев</surname><given-names>Д. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Moskalev</surname><given-names>D. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Дмитрий Николаевич Москалев — кафедра нанотехнологий и микросистемной техники; ассистент кафедра общей физики; научный сотрудник; ведущий инженер‑исследователь</p><p>Пермь</p></bio><bio xml:lang="en"><p>Dmitriy N. Moscalev — M. Sc. Department of Nanotechnologies and Microsystem Technique; assistant, Department of General Physics; researcher; lead research engineer</p><p>Perm</p></bio><email xlink:type="simple">moscalevdn@pnppk.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Салгаева</surname><given-names>У. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Salgaeva</surname><given-names>U. O.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Ульяна Олеговна Салгаева — канд. физ.-мат. наук; эксперт</p><p>Москва</p></bio><bio xml:lang="en"><p>Ulyana O. Salgaeva — PhD expert</p><p>Moscow</p></bio><email xlink:type="simple">ulyanasalgaeva@yandex.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Максименко</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Maksimenko</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Виталий Александрович Максименко — канд. физ.-мат. наук, доцент кафедра общей физики; доцент</p><p>Пермь</p></bio><bio xml:lang="en"><p>Vitaly A. Maksimenko — PhD, Associate Professor  Department of General Physics</p><p>Perm</p></bio><email xlink:type="simple">mva30@mail.ru</email><xref ref-type="aff" rid="aff-4"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Криштоп</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Krishtop</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Виктор Владимирович Криштоп — д-р физ.-мат. наук, профессор  кафедра нанотехнологий и микросистемной техники;  кафедра общей физики; профессор; главный научный сотрудник</p><p>Пермь</p></bio><bio xml:lang="en"><p>Victor V. Krishtop — Dr. Sci., Professor Department of General Physics, professor; Department of Nanotechnologies and Microsystem Technique, professor; chief scientist</p><p>Perm</p></bio><email xlink:type="simple">Krishtop@pnppk.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Пермский национальный исследовательский политехнический университет; Пермская научно-производственная приборостроительная компания</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Perm National Research Polytechnic University; Perm Scientific-Industrial Instrument Making Company</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Пермский национальный исследовательский политехнический университет; Пермская научно-производственная приборостроительная компания; Пермский государственный национальный исследовательский университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Perm National Research Polytechnic University; Perm Scientific-Industrial Instrument Making Company; Perm State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Сколковский институт науки и технологий</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Skolkovo Institute of Science and Technology</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru"><institution>Пермский национальный исследовательский политехнический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Perm National Research Polytechnic University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>07</day><month>05</month><year>2025</year></pub-date><volume>68</volume><issue>4</issue><fpage>310</fpage><lpage>319</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Национальный исследовательский университет ИТМО, 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Национальный исследовательский университет ИТМО</copyright-holder><copyright-holder xml:lang="en">Национальный исследовательский университет ИТМО</copyright-holder><license xlink:href="https://pribor.ifmo.ru/jour/about/submissions#copyrightNotice" xlink:type="simple"><license-p>https://pribor.ifmo.ru/jour/about/submissions#copyrightNotice</license-p></license></permissions><self-uri xlink:href="https://pribor.ifmo.ru/jour/article/view/362">https://pribor.ifmo.ru/jour/article/view/362</self-uri><abstract><p>Исследованы оптические потери в области пересечения изготовленного из золота электрода и оптического волновода из тонкопленочного ниобата лития. Снизить поглощение оптического излучения в волноводе, вызванное слоем золота, возможно путем подбора толщины буферного слоя. С использованием метода конечных элементов и численных методов Мюллера и Ньютона–Рафсона определена зависимость оптических потерь в волноводе от толщины буферного слоя. Показано, что при изменении толщины буферного слоя от нуля до одного микрометра величина оптических потерь в области пересечения волновода и электрода уменьшается с 6·102 до 10–3 дБ/см для фундаментальной TM-моды и с 102 до 10–3 дБ/см — для фундаментальной TE-моды. Корректность расчета подтверждается согласованностью данных, полученных тремя разными методами. Полученные результаты могут быть использованы при проектировании функциональных элементов фотонных интегральных схем (фазовые, амплитудные модуляторы и др.) с минимальными оптическими потерями, обусловленными поглощением изготовленных из золота электродов.</p></abstract><trans-abstract xml:lang="en"><p>The optical losses in the intersection region of a gold electrode and a thin-film lithium niobate optical waveguide are investigated. It is possible to reduce the absorption of optical radiation in the waveguide by selecting the buffer layer thickness. Using the finite element method and the Mueller and Newton–Raphson numerical methods, the dependence of the optical losses in the waveguide on the buffer layer thickness is determined. It is shown that when the buffer layer thickness changes from zero to one micrometer, the optical losses in the intersection region of the waveguide and the electrode decrease from 6·102 to 10–3 dB/cm for the fundamental TM mode and from 102 to 10–3 dB/cm for the fundamental TE mode. The correctness of the calculation is confirmed by the consistency of the data obtained by three different methods. The results can be used in designing functional elements of photonic integrated circuits (phase, amplitude modulators, etc.) with minimal optical losses due to absorption of gold electrodes.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>тонкопленочный ниобат лития</kwd><kwd>оптические потери</kwd><kwd>буферный слой</kwd><kwd>область пересечения оптического волновода и электрода</kwd><kwd>метод Мюллера</kwd><kwd>метод Ньютона–Рафсона</kwd><kwd>метод конечных элементов</kwd></kwd-group><kwd-group xml:lang="en"><kwd>thin film lithium niobate</kwd><kwd>optical losses</kwd><kwd>buffer layer</kwd><kwd>intersection region of optical waveguide and electrode</kwd><kwd>Mueller method</kwd><kwd>Newton-Raphson method</kwd><kwd>finite element method</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">исследования выполнены при поддержке Министерства науки и высшего образования Российской Федерации (проект № FSNM-2023-0006).</funding-statement><funding-statement xml:lang="en">The research was carried out with the support of the Ministry of Science and Higher Education of the Russian Federation (project No. FSNM-2023-0006).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Козлов А., Салгаева У., Журавлев В., Волынцев А. 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