Comparison measure for the wavelength range (2–20) µm

The possibility of creating a measure of the spectral coefficient of diffuse reflection for the wavelength range of 2–20 µm for use in laboratory spectral equipment is discussed. The results of the production of measurement samples and the study of their characteristics are presented in relation to the tasks of measuring the spectral coefficient of diffuse reflection of rough surfaces with low reflection on devices with diffuse reflection prefixes. The proposed approach to the selection of the surface structure, its coating and measure is the basis for measuring the characteristics of a wide range of materials by comparison in the infrared range of 2–20 µm. One of the variants of the comparison measure has been adapted to work on diffuse reflection consoles of domestic fsm series spectrometers. The application of the proposed method makes it possible to significantly increase the efficiency and accuracy (reliability) of measuring the spectral dependences of diffuse reflection coefficients of materials and coatings with rough surfaces and low reflection coefficients.

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