ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)

vol 62 / November, 2019

DOI 10.17586/0021-3454-2016-59-4-311-316

UDC 536.483, 536.332


Y. V. Lapovok
Military Space Academy n.a. A.F. Mozhaisky, Saint Petersburg, Russia; scientific researcher

S. I. Khankov
Military Space Academy n.a. A.F. Mozhaisky, Saint Petersburg, Russia; chief staff scientist

D. A. Mosin
A. F. Mozhaisky Military Space Academy, Department 12; Head of the Department

M. M. Pen’kov
A. F. Mozhaisky Military Space Academy; Head of the Academy

I. A. Urtmintsev
A. F. Mozhaisky Military Space Academy, Department 12;

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Abstract. A method for measuring blackness degree of sample surface in a small cryogenic-vacuum chamber is proposed. Physical and mathematical models of the measuring unit are described. The operation temperature range for blackness degree measurement is defined by the temperature of the cryogenic screen, the film electrical heater power, and duration of heating process. It is shown that for copper samples of 1 mm thick and 2 cm diameter at consumed electric power of a few tenths of a Watt and the screen temperatures from 80 to 150 K, the minimal measurement error is achieved at the processing time from 10 to 20 minutes. The proposed method is reported to reduce the processing time for blackness measurement for two orders of magnitude as compared with measurement in stationary thermal mode. In the proposed method, the specified constant value of the power depends slightly on initial  temperature of the sample. An important advantage of the method consists in significant saving of energy consumption for the screen cryostatting due to reduction of the time of elementary measurement.
Keywords: blackness degree, surface, monotonic heating method, radiative heat exchange, cryogenic-vacuum chamber, flow-through cryostat system

  1. Lienhard J.H.IV, Lienhard J.H.V. A heat transfer textbook, Cambridge, MA, Phlogiston Press, 2008.
  2. Ekkert E.R.G., Drake R.M., Jr. Analysis of Heat and Mass Transfer. Hemisphere Publishing Corp., Washington, D.C., 1987.
  3. Dul'nev G.N., Semyashkin E.N. Teploobmen v radioelektronnykh apparatakh (Heat Exchange in Radio-Electronic Devices), Leningrad, 1968, 360 p. (in Russ.)
  4. Tashlykova-Bushkevich I.I. Fizika Ch.2: Optika. Kvantovaya fizika. Stroenie i fizicheskie svoystva veshchestv (Physics. Part 2: Optics. Quantum Physics. The Structure and Physical Properties of Substances), Minsk, 2008, 182 p. (in Russ.)
  5. Gushchin V.N. Osnovy ustroystva kosmicheskikh apparatov (Bases of the Device of Spacecrafts), Moscow, 2003, 272 p. (in Russ.)
  6. Malozemov V.V. Teplovoy rezhim kosmicheskikh apparatov (Thermal Mode of Spacecrafts), Moscow, 1980, 223 p. (in Russ.)
  7. Malozemov V.V., Kudryavtseva N.S. Sistemy termoregulirovaniya kosmicheskikh apparatov (Systems of Thermal Regulation of Spacecrafts), Moscow, 1995, 112 p. (in Russ.)
  8. Patent RU 2248954С2. Sostav termoreguliruyushchego pokrytiya (Composition of the Temperature-Controlled Coating), Gorbacheva V.V., Bushneva L.I., Rasskazov P.V. et al., Priority 27.03.2005. (in Russ.)
  9.  Patent RU 2510491 G01J5/12 (2006.01). Sposob izmereniya stepeni chernoty (Method of Measuring Degrees of Blackness), Lapovok E.V., Pen'kov M.M., Slinchenko D.A., Urtmintsev I.A., Khankov S.I., Published 11.01.2012. Bull. 9. (in Russ.)
  10. Patent USSR 770333. Sposob izmereniya stepeni chernoty tverdykh tel (Method of Measuring the Degree of Blackness of Solids), Zhigalov V.N., Milkiel' Zh.P., Published 20.11.2005. Bull. 32. (in Russ.)
  11. Lapovok E.V., Khankov S.I. Izv. vuzov. Priborostroenie, 2012, no. 3 (55), pp. 56–60. (in Russ.)
  12. Patent RU 2521131. G01J5/12 (2006.01). Sposob i ustroystvo dlya izmereniya stepeni chernoty (Method and Apparatus for Measuring Degrees of Blackness), Lapovok E.V., Pen'kov M.M., Slinchenko D.A., Urtmintsev I.A., Khankov S.I., Priority 11.01.2012, Published 7.06 2014, Bull. 18. (in Russ.)
  13. Platunov E.S., Baranov I.V., Burovoy S.E., Kurepin V.V. Teplofizicheskie izmereniya (Thermophysical Measurements), St. Petersburg, 2010, 738 р. (in Russ.)
  14. Malkov M.P. Spravochnik po fiziko-tekhnicheskim osnovam kriogeniki (Reference Book on Physics and Technology Bases of a Cryogenics), Moscow, 1985, 432 р. (in Russ.)