DOI 10.17586/0021-3454-2017-60-5-404-411
UDC 681.518.5:004.052.32
ORGANIZATION OF FUNCTIONAL CONTROL SYSTEMS WITH TOTALLY SELF-CHECKING STRUCTURE BASED ON PARAPHASE SIGNALS COMPRESSION MODULES
PSTU; Professor, Department of Automation and Telemechanics on the Railways
V. V. Sapozhnikov
PSTU; Professor, Department of Automation and Telemechanics on the Railways
D. V. Ephanov
PSTU; Department of Automation and Telemechanics on the Railways
Read the full article
Abstract. A standard structure is proposed for system of functional control on the base of logical complements method. The rules of calculation of logical complement functions are established; the rules make it possible to provide a total self-checking of the functional control system structure. Requirements imposed upon the logical device under control are formulated to ensure synthesis of a totally self-checking system of functional control.
Keywords: functional control system, logical complement, totally self-checking structure, paraphase signals compression modules
References:
References:
- Sapozhnikov V.V., Sapozhnikov Vl.V., Dmitriev A.V., Morozov A.V., Gessel' M. Electronic Modeling, 2002, no. 6(24), pp. 51–66. (in Russ.)
- Goessel M., Morozov A.V., Sapozhnikov V.V., Sapozhnikov Vl.V., Dmitriev A.V. Automation and Remote Control, 2003, no. 1, pp. 167–176. (in Russ.)
- Goessel M., Morozov A.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control,2005, no. 8, pp. 161–172. (in Russ.)
- Piestrak S.J. Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wrocław, Oficyna Wydawnicza Politechniki Wrocłavskiej, 1995, 111 p.
- GorsheS.S., Bose B. Proc. of the 14th VLSI Test Symp., Princeton, NJ, USA, 1996, рр. 157–161.
- Nicolaidis M., Zorian Y. J. of Electronic Testing: Theory and Applications, 1998, no. 12, pp. 7–20.
- Das D., Touba N.A. Proc. of the 17th IEEE VLSI Test Symp., Dana Point, CA, USA, Apr. 25–29, 1999, рр. 370–376.
- Lala P.K. Principles of Modern Digital Design, New Jersey, John Wiley & Sons, 2007, 419 p.
- Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Automation on transport, 2015, no. 1(1), pp. 84–107. (in Russ.)
- Efanov D.V., Groshev G.M., Malikov O.B. Russian Electrical Engineering, 2016, no. 5, рр. 53–56. (in Russ.)
- Sogomonyan E.S., Slabakov E.V. Samoproveryaemye ustroystva i otkazoustoychivye sistemy (The Self-Checked Devices and Failure-Safe Systems), Moscow, 1989, 208 р. (in Russ.)
- Goessel M., Saposhnikov Vl., Saposhnikov V., Dmitriev A. Proc. of the 6th IEEE Intern. On-line Testing Workshop, Palma de Mallorca, Spain, July 3–5, 2000, рp. 147–152.
- Saposhnikov V.V., Saposhnikov Vl.V., Morozov A., Osadtchi G., Gossel M. Proc. of East-West Design & Test Workshop, Yalta, Ukraine, 2004, рp. 83–87.
- Göessel M., Ocheretny V., Sogomonyan E., Marienfeld D. New Methods of Concurrent Checking, Dordrecht, Springer Science+Business Media B.V., 2008, 184 p.
- Das D.K., Roy S.S., Dmitriev A., Morozov A., Gössel M. Proc. of the 10th Intern. Workshops on Boolean Problems, Freiberg, Germany, September, 2012, рp. 33–40.
- Efanov D., Sapozhnikov V., Sapozhnikov Vl. Proc. of the 14th IEEE East-West Design & Test Symp. (EWDTS`2016), Yerevan, Armenia, Oct. 14–17, 2016, рр. 117–125.
- Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Journal of Instrument Engineering, 2016, no. 7(59), рр. 524–533. (in Russ.) DOI 10.17586/0021-3454-2016-59-7-524-533.
- Sapozhnikov V., Sapozhnikov Vl., Efanov D. Proc. of the 14th IEEE East-West Design & Test Symp. (EWDTS`2016), Yerevan, Armenia, Oct. 14–17, 2016, рр. 126–133.
- Parkhomenko P.P., Sogomonyan E.S. Osnovy tekhnicheskoy diagnostiki. Optimizatsiya algoritmov diagnostirovaniya, apparaturnye sredstva (Basics of Technical Diagnostics. Optimization of Algorithms of Diagnosing, Hardware Means), Moscow, 1981, 320 р. (in Russ.)
- Goessel M., Graf S. Error Detection Circuits, London, McGraw-Hill, 1994, 261 p.
- Aksenova G.P. Automation and Remote Control, 1979, no. 9, pp. 126–135. (in Russ.)
