ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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12
Issue
vol 60 / DECEMBER, 2017
Article

DOI 10.17586/0021-3454-2017-60-5-460-465

UDC 681.7.063

EFFICIENCY OF BRAGG GRATING INSCRIPTION BY ArF EXCIMER LASER RADIATION DEPENDING ON ORIENTATION OF BIREFRINGENCE AXIS OF ANISOTROPIC OPTICAL FIBER

S. V. Varzhel
ITMO University, Saint Petersburg, 197101, Russian Federation; Associate professor


A. A. Petrov
ITMO University, 197101, Saint-Petersburg, Russian Federation; Associate professor


S. V. Arkhipov
ITMO Univresity, 197101, Saint-Petersburg, Russian Federation; postgraduate


D. A. Palanjyan
ITMO University, Department of Laser Technologies and Applied Ecology, St. Petersburg; Graduate Student


A. S. Munko
ITMO University, Saint Petersburg, 197101, Russian Federation; student


Y. D. Smirnova
ITMO University, Department of Laser Systems and Technologies;; Student


N. S. Kondakova
ITMO University, Department of Light-Guided Photonics; Student


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Abstract. Recording of fiber Bragg grating by ArF excimer laser radiation is investigated. The record schematic under consideration uses of phase mask method and the possibility of pre-orientation of the birefringence axes of the anisotropic optical fiber. Results of type II fiber Bragg gratings inscription by a single ArF excimer laser pulse in an anisotropic optical fiber with elliptical stress cladding at enhanced concentration of germanium dioxide concentration in the fiber core are obtained at various orientation of birefringence axis. Comparative analysis of the results demonstrates that type II Bragg grating inscription is more effective at the fiber with elliptical stress cladding slow birefringence axis positioning perpendicularly to the laser beam propagation direction. Besides, preorientation of the birefringence axes of the anisotropic optical fiber before the fiber Bragg grating inscription is an effective way to reduce the polarization extinction ratio on the induced optical fiber diffraction structure.
Keywords: fiber Bragg grating, birefringence, anisotropy, excimer laser, phase mask

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