Reference for citation: Efanov D. V. Synthesis of self-checking computing devices based on a complete system of special groups of the diagnostic object outputs. Journal of Instrument Engineering. 2023. Vol. 66, N 5. P. 355—372 (in Russian). DOI: 10.17586/0021-3454-2023-66-5-355-372.

Abstract. Features of concurrent error-detection circuit synthesis for a known diagnostic object structure are discussed. A complete set of special groups of outputs that characterize them by some diagnostic parameter is presented. Separation of special groups of outputs allows to select a code for building an integrated control circuit, taking into account the possibility of detecting errors with a specific multiplicity and a certain type. A method for constructing an integrated control circuit is proposed, which involves an analysis of all subsets of the diagnostic object outputs, their classification by belonging to any special group of outputs, as well as the subsequent coverage of all outputs by special groups with the choice of the best coverage method by the criterion of structural redundancy, indicating specific codes to control the calculations. The proposed method is assumed to be effective in several cases of organizing built-in control circuits and to allow synthesizing a self-checking device even when this cannot be achieved by using the duplication method.

Keywords: self-checking device, built-in control circuit, calculation control, special group of outputs, codes with certain type error detection

References:

1. Sogomonyan E.S., Slabakov E.V. Samoproveryaemye ustroystva i otkazoustoychivye sistemy (The Self-Checked Devices and Failure-Safe Systems), Moscow, 1989, 208 р. (in Russ.)
2. Mikoni S.V. Obshchiye diagnosticheskiye bazy znaniy vychislitel'nykh sistem (General Diagnostic Knowledge Bases of Computing Systems) St. Petersburg, 1992, 234 р. (in Russ.)
3. Pradhan D.K. Fault-Tolerant Computer System Design, NY, Prentice Hall, 1996, 560 p.
4. Lala P.K. Self-Checking and Fault-Tolerant Digital Design, San Francisco, Morgan Kaufmann Publishers, 2001, 216 p.
5. Fujiwara E. Code Design for Dependable Systems: Theory and Practical Applications, John Wiley & Sons, 2006, 720 p.
6. Drozd A.V., Kharchenko V.S., Antoshchuk S.G., Drozd Yu.V., Drozd M.A., Sulima Yu.Yu. Rabocheye diagnostirovaniye bezopasnykh informatsionno-upravlyayushchikh sistem (Working Diagnostics of Safe Information and Control Systems), Khar’kov, 2012, 614 р. (in Russ.)
7. Nikolos D. Chapter 7 in On-Line Testing for VLSI, 1998, pp. 69–79, DOI 10.1007/978-1-4757-60-69-9_7.
8. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V., Dmitriev V.V. Automation and Remote Control, 2017, no. 2(78), pp. 300–312, DOI: https://doi.org/10.1134/S0005117917020096.
9. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Kody s summirovaniyem dlya sistem tekhnicheskogo diagnostirovaniya. T. 1. Klassicheskiye kody Bergera i ikh modifikatsii (Summed Codes for Technical Diagnostic Systems. Vol. 1. Classical Berger Codes and Their Modifications), Moscow, 2020, 383 р. (in Russ.)
10. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Kody s summirovaniyem dlya sistem tekhnicheskogo diagnostirovaniya. T. 2. Vzveshennyye kody s summirovaniyem (Summed Codes for Technical Diagnostic Systems. Vol. 2. Weighted Codes with Summation), Moscow, 2021, 455 р. (in Russ.)
11. Berezyuk N.T., Andrushchenko A.G., Moshchitskiy S.S., Glushkov V.I., Benesha M.M., Gavrilov V.A. Kodirovaniye informatsii (dvoichnyye kody) (Information Coding (Binary Codes)), Khar'kov, 1978, 252 р. (in Russ.
12. Baghdadi A.A.A., Hahanov V.I., Litvinova E.I. Management Information System and Devices, 2014, no. 166, pp. 59–74. (in Russ.)
13. Patent US 747533, Self-Checking Error Checker for Two-Rail Coded Data, W.C. Carter, K.A. Duke, P.R. Schneider, Priority July 25, 1968, Published Jan. 26, 1971.
14. Sogomonyan E.S., Gössel M. Journal of Electronic Testing: Theory and Applications, 1993, no. 4(4), pp. 267–281, DOI: 10.1007/BF00971975.
15. Busaba F.Y., Lala P.K. Journal of Electronic Testing: Theory and Applications, 1994, no. 1, pp. 19–28, DOI: 10.1007/BF00971960.
16. Matrosova A.Yu., Ostanin S.A. Proceedings of the IEEE European Test Workshop (ETW’98), May 27–29, 1998, Sitges, Barcelona, Spain.
17. Berger J.M. Information and Control, 1961, no. 1(4), pp. 68–73, DOI: 10.1016/S0019-9958(61)80037-5.
18. Morosow A, Saposhnikov V.V., Saposhnikov Vl.V., Goessel M. VLSI Design, 1998, no. 5(4), pp. 333–345, DOI: 10.1155/1998/20389.
19. Saposhnikov V.V., Morosov A., Saposhnikov Vl.V., Göessel M. Journal of Electronic Testing: Theory and Applications, 1998, no. 1-2(12), pp. 41–53, DOI: 10.1023/A:1008257118423.
20. Göessel M., Ocheretny V., Sogomonyan E., Marienfeld D. New Methods of Concurrent Checking: Edition 1, Dordrecht, Springer Science+Business Media B.V., 2008, 184 p.
21. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Journal of Instrument Engineering, 2015, no. 5(58), pp. 333–343, DOI: 10.17586/0021-3454-2015-58-5-333-343. (in Russ.)
22. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control, 2017, no. 5(78), pp. 891–901, DOI: https://doi.org/10.1134/S0005117917050113.
23. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automatic Control and Computer Sciences, 2020, no. 4(54), pp. 279–290, DOI: 10.3103/S0146411620040045.
24. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control, 2018, no. 9(79), pp. 1609–1620DOI: https://doi.org/10.1134/S0005117918090060.
25. Aksyonova G.P. Automation and Remote Control, 1973, no. 2(34), pp. 267–273.
26. Hamming R.W. Bell System Technical Journal, 1950, no. 2(29), pp. 147–160, MR0035935.
27. Sapozhnikov V., Sapozhnikov Vl., Efanov D., Dmitriev V. Proceedings of 14th IEEE East-West Design & Test Symposium (EWDTS’2016), Yerevan, Armenia, October 14–17, 2016, pp. 134–141, DOI: 10.1109/EWDTS.2016.7807686.
28. Sapozhnikov V., Efanov D., Sapozhnikov Vl., Dmitriev V. Proceedings of 13th IEEE East-West Design & Test Symposium (EWDTS’2015), Batumi, Georgia, September 26–29, 2015, pp. 154–159, DOI: 10.1109/EWDTS.2015.7493123.
29. Freiman C.V. Information and Control, 1962, no. 1(5), pp. 64–71, DOI: 10.1016/S0019-9958(62)90223-1.
30. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Electronic modeling, 2017, no. 3(39), pp. 37–60. (in Russ.)
31. Efanov D.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Trudy SPIIRAN (SPIIRAS Proceedings), 2017, no. 5(29), рр. 39–60, DOI: 10.15514/ISPRAS-2017-29(5)-3. (in Russ.)
32. Sapozhnikov V.V., Sapozhnikov Vl.V., Efanov D.V. Electronic modeling, 2020, no. 2(42), pp. 3–23, DOI: 10.15407/emodel.42.02.003. (in Russ.)
33. Zakrevskiy A.D., Pottosin Yu.V., Cheremisina L.D. Logicheskiye osnovy proyektirovaniya diskretnykh ustroystv (Logical Basis for Designing Discrete Devices), Moscow, 2007, 592 р. (in Russ.)
34. Nicolaidis M., Zorian Y. Journal of Electronic Testing: Theory and Application, 1998, no. 1–2(12), pp. 7–20, DOI: 10.1023/A:1008244815697.
35. Mitra S., McCluskey E.J. Proceedings of International Test Conference, 2000, USA, Atlantic City, NJ, October 03–05, 2000, pp. 985–994, DOI: 10.1109/TEST.2000.894311.
36. Sapozhnikov V.V., Sapozhnikov Vl.V. Samoproveryaemye diskretnye ustroystva (The Self-Checked Discrete Devices), St. Petersburg, 1992, 224 p. (in Russ.)
37. Piestrak S.J. Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wrocław, Oficyna Wydawnicza Politechniki Wrocłavskiej, 1995, 111 p.
38. Gessel M., Morozov A.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control, 2003, no. 1(64), pp. 153–161, DOI: https://doi.org/10.1023/A:1021884727370.
39. Goessel M., Morozov A.V., Sapozhnikov V.V., Sapozhnikov Vl.V. Automation and Remote Control, 2005, no. 8, pp. 1336–1346.