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vol 67 / April, 2024
Article

DOI 10.17586/0021-3454-2023-66-11-936-949

UDC 535.8

METHODOLOGY FOR EFFECTIVE COMPUTER MODELING OF A DEVICE FOR MEASURING LIGHT SCATTERING PROPERTIES

V. G. Sokolov
ITMO University, Faculty of Software Engineering and Computer Systems; Senior Researcher


I. S. Potemin
ITMO University, Faculty of Software Engineering and Computer Systems;


D. D. Zhdanov
ITMO University, Saint Petersburg, 197101, Russian Federation ; Associate Professor

Reference for citation: Sokolov V. G., Potemin I. S., Zhdanov D. D. Methodology for effective computer modeling of a device for measuring light scattering properties. Journal of Instrument Engineering. 2023. Vol. 66, N 11. P. 936—949 (in Russian). DOI: 10.17586/0021-3454-2023-66-11-936-949.

Abstract. The problem of computer simulation of an optical system with light scattering elements is considered. Correctly modeling devices with such elements requires lengthy light calculations using stochastic ray tracers. An approach to efficient modeling of such installations is presented using the example of a patented device designed to measure the bidirectional scattering function, which is used to describe light scattering properties. A realistic computer model of such a device is proposed, which makes it possible to calculate tolerances for deviations in the positioning of the most critical device blocks, and an assessment of the accuracy of its measurements is carried out. Results of measurement simulations of bidirectional functions are presented in the form of graphs and synthesized images.
Keywords: computer simulation, bidirectional scattering distribution function, bidirectional reflectance distribution function, bidirectional transmittance distribution function

Acknowledgement: this work was supported by the Russian Science Foundation, grant No. 22-11-00145.

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