NEAR-FIELD MICROSCOPY WITH A LINEAR NANOPROBE SUPPORTING PLASMONS
Ioffe Physical-Technical Institute RAS; SaintPetersburg State Polytechnical University, Department of Solid-State Electronics; Professor
Abstract. Basic ideas of near-field microscopy with a linear nanoprobe scanning a sample surface at a subwavelength distance are discussed. The probe in question is a noble-metal nanowire supporting surface plasmons. In conformity with the near-field microscopy of a magnetic domain, the polarization effects and plasmon-enhanced intensity of magnetooptical scattering are studied depending on the probe location.
Keywords: near-field optics, magneto-optics, microscopy, scattering of light, plasmon, electromagnetic enhancement.