ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
Menu

10
Issue
vol 60 / OCTOBER, 2017
Article
UDC 004.031.6

METHOD OF REVERSE RANDOM SAMPLING FOR MEASUREMENT OF TIME DELAY IN ELEMENT OF THE INTEGRATED CIRCUIT WITH PICOSECOND ACCURACY

S. . Churayev
ITMO University; Postgraduate


Read the full article 

Abstract.   A new method of propagation delay measurement in micro- and nanostructures is described. The method makes it possible to observe the propagation time delay in a single element of standard-cell library and is accurate to better than 1 picoseconds.
Keywords:   random-sampling standard cell characterization, phase error accumulation methodology, gate propagation delay, high precision on-chip measurement, signal processing, BIST, DFT, memory, processor testing, MEMS testing.