ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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3
Issue
vol 60 / MARCH, 2017
Article
UDC 004.272.3+004.052.2

ON ORGANIZATION OF BUILT-IN HARDWARE-LEVEL MUTUAL SELF-TEST IN LOGICAL MULTI-CONTROLLERS

R. V. Bredikhin
South-West State University, Department of Computer Science, Kursk; Post-Graduate Student


L. . Nyan
South-West State University, Department of Information Systems and Technologies, Kursk; Post-Graduate Student


I. V. Zotov
Kursk State Technical University, Department of Computer Technique; Professor


Abstract.   Basic principles of built-in hardware-level self-test in mesh-connected logical multi-controllers are formulated. The aim of the approach is an efficient detection of faulty units based on recurring mutual physical neighbor test actions and making faulty/non-faulty decision using the majority operation.
Keywords:   logical multi-controllers, reliability, fault tolerance, hardware-level test, mutual test, majority operation