ON ORGANIZATION OF BUILT-IN HARDWARE-LEVEL MUTUAL SELF-TEST IN LOGICAL MULTI-CONTROLLERS
South-West State University, Department of Computer Science, Kursk; Post-Graduate Student
L. . Nyan
South-West State University, Department of Information Systems and Technologies, Kursk; Post-Graduate Student
I. V. Zotov
Kursk State Technical University, Department of Computer Technique; Professor
Abstract. Basic principles of built-in hardware-level self-test in mesh-connected logical multi-controllers are formulated. The aim of the approach is an efficient detection of faulty units based on recurring mutual physical neighbor test actions and making faulty/non-faulty decision using the majority operation.
Keywords: logical multi-controllers, reliability, fault tolerance, hardware-level test, mutual test, majority operation