DOI 10.17586/0021-3454-2015-58-3-236-240
UDC 53.084.85
METROLOGICAL STUDY OF ATOMIC EMISSION SPECTROMETERS BASED ON CCD LINES
ITMO University, Department of Optical Instruments Computerization and Design; Student
R. K. Mamedov
ITMO University; Department of Computer Photonics and Digital Video Processing, St. Petersburg;
Read the full article
Abstract. Analytical capabilities and metrological characteristics of commercial atomic emission spectrometers using CCD lines as optical detectors are studied. Results of experiments on detection limits and accuracy of measurements of chemical elements concentrations in samples of metals and alloys are presented.
Keywords: atomic emission spectral analysis, spark spectrometer, position-sensitive detector, CCD line.
