ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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3
Issue
vol 60 / MARCH, 2017
Article
UDC 535.51:681.4.023

ELLIPSOMETRY OF OPTICAL CONNECTIONS OPTOELECTRONICS ELEMENTS

V. T. Prokopenko
ITMO University, Saint Petersburg, 197101, Russian Federation; Professor


I. A. Khramtsovsky
ITMO University, Saint-Petersburg, 197101, Russia; leading engineer


Землянский В. С.
;


Y. V. Litvinov
St. Petersburg State University of Information Technologies, Mechanics and Optics, Department of Control Systems and Informatics;


Секарин К. Г.
;


Abstract. Ellipsometry method of the analysis of polarization-optical properties of elements of optoelectronics in without adhesive optical connections are considered. Methods of diagnostics tensely-deformed conditions of elements and definitions of their optical characteristics in a zone of optical contact of non-uniform superficial layers are submitted.
Keywords: ellipsometry, optical connections, elements of optoelectronics.