ELLIPSOMETRY OF OPTICAL CONNECTIONS OPTOELECTRONICS ELEMENTS
ITMO University, Saint Petersburg, 197101, Russian Federation; Professor
I. A. Khramtsovsky
ITMO University, Saint-Petersburg, 197101, Russia; leading engineer
Землянский В. С.
Y. V. Litvinov
St. Petersburg State University of Information Technologies, Mechanics and Optics, Department of Control Systems and Informatics;
Секарин К. Г.
Abstract. Ellipsometry method of the analysis of polarization-optical properties of elements of optoelectronics in without adhesive optical connections are considered. Methods of diagnostics tensely-deformed conditions of elements and definitions of their optical characteristics in a zone of optical contact of non-uniform superficial layers are submitted.
Keywords: ellipsometry, optical connections, elements of optoelectronics.