MINIMAL NECESSARY EXTENT OF EXAMINATIONS OF MICROELECTRONIC PRODUCTS AT INSPECTION TEST STAGE
JSC “Technical Testing Center — NPO PM”; Deputy Director
V. v. Orlov
JSC “Technical Testing Center — NPO PM”; Director
Abstract. The minimal necessary extent of screening tests for microelectronic products to be used in space vehicle apparatus is determined. The proposed approach allows for reduction of cost of inspection tests carried out to ensure reliability of the apparatus and the space vehicle as a whole.
Keywords: electronic products, additional screening tests, destructive physical analysis, electrothermal training.