ANALYSIS OF IMAGES IN X-RAY MICROTOMOGRAPHY
Tomsk State University, Interuniversity Training and Scientific Production Center “Technological Management”; Director of the Center, Professor
V. A. Borodin
Tomsk State University, Department of Operation Research; Post-Graduate Student
A. V. Osipov
Tomsk State University, Department of Operation Research; Post-Graduate Student
A. V. Vasiliev
Public Corporation “Federal Research Institute of Semiconductor Devices”, Tomsk; Chief of Group
G. S. Glushkov
Public Corporation “Federal Research Institute of Semiconductor Devices”, Tomsk; Engineer-Programmer
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Abstract. Principles of restoration and analysis of image in x-ray microtomography of organic and non-organic objects are discussed. Application of microtomography in material diagnostics is considered.
Keywords:
image, technical diagnostics, microtomography
