ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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Author
int(6337)

Alexander V. Vasiliev

Work place: Public Corporation “Federal Research Institute of Semiconductor Devices”, Tomsk
Post: Chief of Group
Vladimir I. Syryamkin, Vladimir A. Borodin, Artem V. Osipov, Alexander V. Vasiliev, Gleb S. Glushkov ANALYSIS OF IMAGES IN X-RAY MICROTOMOGRAPHY
The article was published in issue2(55) за 2012