ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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Ulyana O. Salgaeva

Work place: Skolkovo Institute of Science and Technology
Post: expert
Degree: PhD
E-mail: ulyanasalgaeva@yandex.ru
Anna V. Bulatova, Dmitry N. Moskalev , Ulyana O. Salgaeva, Vitaly A. Maksimenko, Viktor V. Krishtop DEPENDENCE OF OPTICAL LOSSES ON THE THICKNESS OF THE BUFFER LAYER BETWEEN A THIN-FILM LITHIUM NIOBATE WAVEGUIDE AND A METAL ELECTRODE
The article was published in issue4(68) за 2025