DOI 10.17586/0021-3454-2024-67-1-5-19
UDC 004.052.42+681.518.5
CHECKERS OF SELF-DUAL AND "CLOSE IN MEANING" SIGNALS
PSTU; Department of Automation and Telemechanics on the Railways
D. V. Pivovarov
Emperor Alexander I St. Petersburg State Transport University, De-partment of Automation and Remote Control on Railways; Assistant
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Reference for citation: Efanov D. V., Pivovarov D. V. Checkers of self-dual and "close in meaning" signals. Journal of Instrument Engineering. 2024. Vol. 67, N 1. P. 5—19 (in Russian). DOI: 10.17586/0021-3454-2024-67-1-5-19.
Abstract. The features of the application of self-dual and “close in meaning” functions properties for the synthesis of highly reliable digital systems using the data inversion method are considered. It is proposed to use the properties of self-anti-dual functions when controlling calculations in devices implemented with the use of time redundancy and pulse mode of operation. The checker for self-anti-dual signals is developed. The conditions for synchronizing the delay element, the frequency of changing the operating and inverse input combinations, the frequency of the signal at the synchronization input of the checker and the moment of changing the working input combination, necessary for the correct operation of the built-in control circuits, are determined.
Abstract. The features of the application of self-dual and “close in meaning” functions properties for the synthesis of highly reliable digital systems using the data inversion method are considered. It is proposed to use the properties of self-anti-dual functions when controlling calculations in devices implemented with the use of time redundancy and pulse mode of operation. The checker for self-anti-dual signals is developed. The conditions for synchronizing the delay element, the frequency of changing the operating and inverse input combinations, the frequency of the signal at the synchronization input of the checker and the moment of changing the working input combination, necessary for the correct operation of the built-in control circuits, are determined.
Keywords: self-testing digital devices, data reverse method, temporary redundancy, self-dual Boolean function, self-anti-dual Boolean function, self-dual signal checker, self-anti-dual signals checker
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