AN ADVANCED DEVICE FOR FAST MEASUREMENT OF ANGLE DEPENDENCE OF LASER BEAM REFLECTION
North-West State Technical University, Department of Physics, St. Petersburg;
V. V. Manukhov
North-West State Technical University, Department of Physics, St. Petersburg; Post-Graduate Student
A. B. Fedortsov
North-West State Technical University, Department of Physics, St. Petersburg; Professor
Y. V. Churkin
North-West State Technical University, Department of Physics; Cand. Techn. Sci
Read the full article
Abstract. Two optical-mechanical installations realizing the fast variation of angle of laser beam incidence upon a steady sample surface with subsequent registration of reflected beam intensity are described. Application of spherical lenses or mirrors instead of the elliptic ones lowers the device cost significantly.
Keywords:
incidence angle, laser interferometry, thin films.
