ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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Author
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Kirillovsky Vladimir K.

Work place: State Educational Establishment of High Professional Education “Saint-Petersburg State University of Information Technologies, Mechanics and Optics”
Post: Professor
Degree: D. Sc., Professor
E-mail: vkkir@yandex.ru
Kirillovsky Vladimir K., Yegor Gavrilov, Zhevlakov P Alexander APPLICATION OF COMPUTER ISOPHOTOMETRY FOR CHECKING OF OBJECTIVE FOR NANOLITHOGRAPHY
The article was published in issue1(54) за 2011
Kirillovsky Vladimir K., Aleksey M. Golubev MODERNIZATION OF ABBE REFRACTOMETER AND THEORETICAL JUSTIFICATION OF INCREASE IN ITS ACCURACY
The article was published in issue1(57) за 2014
Zatsepina Marina E., Kirillovsky Vladimir K. DEVELOPMENT OF MODERN QUANTITATIVE SHADOW METHOD
The article was published in issue3(57) за 2014
Zatsepina Marina E., Kirillovsky Vladimir K. SHADOW IMAGE OF LINEAR GRATING AS A GEOMETRICAL MODEL OF SHEARING INTERFEROGRAM
The article was published in issue5(57) за 2014
Zatsepina Marina E., Kirillovsky Vladimir K. MEASURING THE WAVE ABERRATION IN OPTICAL SYSTEMS BY THE DIGITAL SHADOW METHOD
The article was published in issue2(59) за 2016
Zatsepina Marina E., Kirillovsky Vladimir K. IMPLEMENTATION OPTIONS FOR DIGITAL SHADOW METHOD OF CONTROL OVER WAVE ABERRATIONS ON THE EXAMPLE OF HELIOS-44 LENS TESTING
The article was published in issue5(59) за 2016
Kirillovsky Vladimir K., Gubaidullin Kamil R. IMPROVING THE ACCURACY OF LINNIK MICROINTERFEROMETER
The article was published in issue4(60) за 2017
Kirillovsky Vladimir K., Tatiana V. Tochilina APPLICATION OF COMPUTER ISOPHOTOMETRIC METHOD IN INTERFEROMETRY
The article was published in issue2(64) за 2021
Kirillovsky Vladimir K., Tatiana V. Tochilina INVARIANCE OF THE ISOPHOTOMETRY PRINCIPLES IN COMPUTER SIMULATION OF INTERFEROGRAM
The article was published in issue4(64) за 2021
Kirillovsky Vladimir K., Tatiana V. Tochilina ISOPHOTOMETRIC METHOD FOR DETERMINING LOW-INTENSITY SPECTRUM LINESCARS
The article was published in issue7(65) за 2022
Kirillovsky Vladimir K., Tatiana V. Tochilina DIFFRACTION INTERFEROMETERS. ANALYTICAL REVIEW
The article was published in issue3(67) за 2024