MINIMAL NECESSARY EXTENT OF EXAMINATIONS OF MICROELECTRONIC PRODUCTS AT INSPECTION TEST STAGE
JSC “Russian Institute of Power Radiobuilding”, Saint Petersburg, 199048, Russian Federation; ITMO University, Saint Petersburg, 197101, Russian Federation; engineer; Associate Professor
V. v. Orlov
JSC “Technical Testing Center — NPO PM”; Director
Read the full article
Abstract. The minimal necessary extent of screening tests for microelectronic products to be used in space vehicle apparatus is determined. The proposed approach allows for reduction of cost of inspection tests carried out to ensure reliability of the apparatus and the space vehicle as a whole.
Keywords:
electronic products, additional screening tests, destructive physical analysis, electrothermal training.
