INFORMATION TECHNOLOGIES AND SYSTEMS
Igor F. Shishkin, Aleksey G. Sergushev ON ESTIMATION OF EFFICIENCY OF OBJECT-DETECTING FACILITIES
5-5
Musalimov Viktor M., Olga E. Dick, Tyurin Andrey ACTION PARAMETERS OF ENERGY SPECTRUM OF WAVELET TRANSFORM
10-10
Elena N. Petrova, Konstantin Korotkov, Dmitry Orlov, Короткова А. К. PRINCIPLES OF CONSTRUCTION AND STRUCTURE OF AUTOMATED HARD- AND SOFTWARE COMPLEX FOR ESTIMATION OF STATE OF HEALTH
16-16
DEVICES AND SYSTEMS OF AUTOMATIC CONTROL
Furtat Igor B., Aleksander M. Tsykunov ADAPTIVE CONTROL OF LINEAR SYSTEMS WITH UNKNOWN SIGN OF HIGHFREQUENCY GAIN
21-21
27-27
COMPUTING TECHNIQUE
Michail Yu. Budko IMPROVEMENT OF NETWORK SECURITY ON THE BASE OF DATA STREAM ANALYSIS
31-31
Alexei V. Girik APPLICATION OF MULTICRITERIA PREDICTION METHODS IN SYSTEMS FOR DETECTION OF NETWORK INTRUSIONS
34-34
ELECTRONIC AND ELECTROMAGNETIC DEVICES
Sergey I. Ziatdinov ESTIMATION OF NONLINEAR DISTORTION OF SIGNAL CAUSED BY ELECTRON AMPLIFIER
38-38
Yury I. Senkevich AUTOMATION OF MEDICAL SUPERVISION IN POLAR ZONE
42-42
OPTICAL AND OPTO-ELECTRONIC INSTRUMENTS AND SYSTEMS
Vsevolod D. Smirnov, Irina V. Knoroz, Svetlana E. Gersanova SENSITIVITY OF OPTO-ELECTRONIC DEVICES AT LOW CONTRAST BETWEEN OBJECT AND BACKGROUND
47-47
Lebedko Yevgeny Georgievich, Nguen Vu Tung ERROR IN MEASUREINENT OF RADIAL EXTENT OF A SURFACE AT MONOPULSE IRRАDIATION
50-50
HEAT REGIMES AND RELIABILITY OF INSTRUMENTS AND SYSTEMS
Evgeny N. Merkuhin APPLICATION OF GRAPH MODELS FOR THE SPACE OF ALLOWABLE SOLUTIONS TO THE PROBLEM OF ARRANGEMENT OF ELECTRONIC ELEMENTS
56-56
61-61
Платунов Е. С., Igor V. Baranov, Platunov Alexey E THERMOPHYSICS LABORATORY OF LOW-TEMPERATURE
65-65
INSTRUMENT-MAKING TECHNOLOGY
Skvortsov Albert Matveevich, Vladimir Chuiko, Le Duy Tuan, Pham Quang Tung FORMATION OF REGULAR ARRAY OF SILICON NANOCLUSTERS BY METHOD OF PROJECTION LASER IRRADIATION
69-69
Vladimir E. Makhov, Aleksander G. Palaev, Anatoly I. Potapov AUTOMATION OF WELDED SEAMS QUALITY ASSURANCE WITH THE USE OF ULTRASONIC TECHNOLOGY
75-75
BRIEF NOTES
Svetlana A. Boyashova METROLOGICAL BASIS FOR DEVELOPMENT OF AUTOMATED TESTING SYSTEM
82-82
