INFORMATION TECHNOLOGIES AND SYSTEMS
Bochenina Klavdiya O., Butakov Nikolay A., Boukhanovsky Alexander V SCHEDULING SETS OF COMPOSITE APPLICATIONS WITH SOFT DEADLINES IN TIME WINDOWS OF HETEROGENEOUS COMPUTING ENVIRONMENTS
295-301
Pavlov Andrey S., Ushakov Anatoly Vladimirovich ANALYSIS OF PROCESS QUALITY IN TIME-VARIANT DISCRETE MULTICHANNEL SYSTEMS
302-310
COMPUTER TECHNIQUE
Kaplin Alexander Yu., Stepanov Mikhail G., Yarmolich Alexey G. THE KALMAN FILTER PROPERTIES IN TRANSITION REGIME
311-317
Victor G. Starodubtsev, Popov Anton M. GORDON—MILLS—WELCH SEQUENCES OF PERIOD N = 1023
318-330
OPTICAL AND OPTO-ELECTRONIC INSTRUMENTS AND SYSTEMS
Prokopenko Victor T., Majorov Evgeniy E., Mashek Alexander Ch., Tsygankova Galina A., Khaidarov Andrey G., Abramian Volodia K., Zaitsev Yury E., Khaidarov Gennady G. APPLICATION OF CROSS-SHEAR INTERFEROMETRY IN HOLOGRAPHY FOR CONTROL OF GEOMETRIC PARAMETERS OF DIFFUSE-REFLECTING SURFACES
331-339
Munko Anna S., Varzhel Sergey V., Arkhipov Sergey Vladimirovich, Kirill A. Konnov DEVELOPMENT OF A SENSITIVE ELEMENT FOR FIBER-OPTIC STRAIN GAUGE BASED ON BRAGG GRATINGS
340-346
Kofnov Oleg V., Lebedev Eugeny L., Mikhailenko Alexander V. DETERMINING COORDINATES OF LOCAL MAXIMA OF LIGHT SIGNAL INTENSITY IN DIFFRACTION PATTERN OF THE SURFACE WITH PERIODIC STRUCTURE
347-352
Latyev Svyatoslav M, Tabachkov Alexey G., Frolov Dmitry N., Krynin Lev I., Gnezdilova Mariyа S. CALCULATION OF BACKLASHES IN CONJUGATION OF OPTICAL COMPONENTS OF A LENS AND ITS ADJUSTMENT
353-358
SCIENTIFIC AND PRACTICAL DEVELOPMENTS
Andrey P. Aleoshkin , Timothy O. Myslivtsev, Bakursky Klim V., Мoskalyev Viktor M. ELECTRIC BREAKDOWN OF AIR BY NANOSECOND PULSES OF ELECTROMAGNETIC RADIATION
359-366
Belikov Andrey V., Gagarsky Sergey V., Andrey N. Sergeev, Smirnov Sergey N. STUDY OF HYDRODYNAMIC PROCESSES IN LIQUIDS UNDER THE INFLUENCE OF POWERFUL MICROSECOND YB,ER:GLASS LASER PULSES
367-374
Dukin Roman V., Shandybina Galina D., Kuzmin Evgeny V. SURFACE PLASMON-RESONANCE SENSOR FOR EXPRESS ANALYSES
375-380
BRIEF NOTES
Kirillovsky Vladimir K., Gubaidullin Kamil R. IMPROVING THE ACCURACY OF LINNIK MICROINTERFEROMETER
381-385
