ISSN 0021-3454 (print version)
ISSN 2500-0381 (online version)
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Author
int(22146)

Vladimir V. Verevkin

Work place: Proton-Electroteks JSC, Department of Semiconductor Instruments Test-ing; Head of the Department
Degree: канд. техн. наук
Vladimir V. Verevkin, Stanislav L. Strigunov, Anastasia P. Pilipenko, Kirill A. Volobuev, Valentina A. Lobanova Tests of Multi-Chip IGBT-Modules for Resistance to Cyclic Power Current
The article was published in issue5(63) за 2020