INFORMATION TECHNOLOGIES AND SYSTEMS
Tulupyev Aleksander L DATA CONSISTENCY AND ALTERNATIVE PROBABILITY ESTIMATES IN A STOCHASTIC PREFERENCES CYCLE
3-3
Viktor T. Domojirov COMBINATIONS ORDERING METHOD IN STRUCTURAL DYNAMICS OF TECHNICAL SYSTEMS
8-8
Yury A. Ipatov, Alexander V. Krevetsky LOCALIZATION OF TEXTURAL AREAS BOUNDS IN DIGITAL IMAGES OF WOOD SAMPLES
12-12
Vladimir Manoilov, Aleksey I. Solodovnikov, Igor V. Zarutskiy SPECTRAL TRANSFORMS IN ADAPTED BASIS FOR REVEALING IMPURITIES IN ISOTOPE MASS-SPECTRA OF TRANS-URANIUM ELEMENTS
17-17
Ahmed Balhareth, Pavel I. Paderno ESTIMATION OF OPERATOR’S WORK INTENSITY WITH THE USE OF AUTOMATED QUESTIONING
22-22
DEVICES AND SYSTEMS OF AUTOMATIC CONTROL
Vitaly K. Semenikhin, Dmitry V. Kirichenko AUTONOMOUS CONTROL OVER SMALL SPACECRAFT APPROACHING ORBITAL OBJECT
27-27
Mikhail G. Kudinov, Silantev Sergey B. , Andrey V. Stepovoy CONTROL OVER RELATIVE MOVEMENT OF SPACE VEHICLE FOR SUPERVISION OF ORBITAL OBJECTS BY PASSIVE MEANS
30-30
Evgeny D. Likholetov, Ushakov Anatoly Vladimirovich, Artyom Tsventarny CROSS-TALK PROBLEM IN DYNAMIC SYSTEMS OF THE “2D INPUT — OUTPUT” CLASS WITH DUPLICATE CHANNELS
35-35
43-43
GYROSCOPIC AND NAVIGATION SYSTEMS
Stanislav G. Nikolaev CALIBRATION OF STAPDOWN INERTIAL NAVIGATION SYSTEM
50-50
Dmitry L. Zaytsev, Vadim M. Agafonov, Anna S. Shabalina NOISE CHARACTERISTICS FOR ANGULAR MOLECULAR-ELECTRONIC TRANSDUCERS
55-55
OPTICAL AND OPTO-ELECTRONIC INSTRUMENTS AND SYSTEMS
Nicolay V. Semidetnov SIGNAL SIMULATION FOR LASER DOPPLER ANEMOMETER APPLIED TO PARTICLES SIZE AND VELOCITY MEASUREMENT IN TWO-PHASE FLOW
60-60
Vsevolod D. Smirnov, Irina V. Knoroz, Svetlana E. Gersanova, Aleksander Е. Bendugovsky TESTING OF OPTIC-ELECTRONIC ONBOARD SPACE OBSERVING SYSTEMS
66-66
HEAT REGIMES AND RELIABILITY OF INSTRUMENTS AND SYSTEMS
Valery P. Alekseev, Vadim M. Karaban ANALYSIS AND OPTIMIZATION OF CONSTRUCTION AND TECHNOLOGICAL FACTORS AFFECTING ACCURACY OF HYBRID-FILM MICRO THERMOSTAT
70-70
Andrey V. Mityakov GRADIENT HEAT FLUX MEASUREMENT IN PHYSICAL AND INDUSTRIAL EXPE
75-75
